Products
Mixed Signal Test Solutions
product series image

WPZi-SDM

Serial Data Mask Software Package for WavePro Zi Series


  • product line tab
  • overview tab
  • product detail tab

    Serial Data Analysis


HDO6000B High Definition Oscilloscopes
HDO6K-SDAX-NRZ - NRZ Serial Data Analysis Framework, Eye,Jitter, Noise and Crosstalk Measurements
HDO6K-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
HDO6K-SDM - Serial Data Mask Software Package for HDO6000
WaveRunner 9000 Oscilloscopes
WR9K-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements for WaveRunner 9000
WR9K-SDAX-NRZ - NRZ Serial Data Analysis Framework, Eye,Jitter, Noise and Crosstalk Measurements
WR9K-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WR9K-EyeDrII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WR9K-SDM - Serial Data Mask Software Package for WaveRunner 9000
WR9K-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WaveRunner 9000
WR9K-CBL-DE-EMBED - Cable De-Embedding Option for WaveRunner 9000
WaveRunner 8000HD 8 Channel High Definition Oscilloscopes
WR8KHD-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WR8KHD-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WR8KHD-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WaveRunner/MDA 8000HD
WR8KHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WR8KHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WR8KHD-SDM - Serial Data Mask Software Package for WaveRunner/MDA 8000HD
WR8KHD-CBL-DE-EMBED - Cable De-Embedding Option for WaveRunner/MDA 8000HD
MDA 8000HD Motor Drive Analyzers
WR8KHD-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WaveRunner/MDA 8000HD
WR8KHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WR8KHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WR8KHD-SDM - Serial Data Mask Software Package for WaveRunner/MDA 8000HD
WR8KHD-CBL-DE-EMBED - Cable De-Embedding Option for WaveRunner/MDA 8000HD
WavePro HD Oscilloscopes
WPHD-CBL-DE-EMBED - Cable De-Embedding Option for WavePro HD
WPHD-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
WPHD-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
WPHD-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
WPHD-SDAX-DP - SDA Expert Technology Framework for DisplayPort
WPHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WPHD-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements for WavePro HD
WPHD-EYEDRII-VP - Bundle - EyeDrII and VirtualProbe Toolkits
WPHD-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WavePro HD
WPHD-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WPHD-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WPHD-SDAIII-COMPLETELINQ - Multi-Lane SDA LinQ incl. Eye, Jitter, Noise, Xtalk Meas, EyeDrII & VirtualProbe for WavePro HD
WPHD-SDM - Serial Data Mask Software Package for WavePro HD
WPHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WaveMaster / SDA / DDA 8 Zi-B Oscilloscopes
WM8ZI-SDAX-USB4-TBT - SDA Expert Technology Framework for USB4 and Thunderbolt 3
WM8ZI-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
WM8ZI-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
WM8ZI-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
WM8ZI-SDAX-DP - SDA Expert Technology Framework for DisplayPort
WM8Zi-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements for WaveMaster 8 Zi Series
SDA8Zi-CompleteLinQ - Bundle - Multi-Lane SDA LinQ Framewk, incl. Eye, Jitter, Noise, Xtalk Meas, w/EyeDrII & VirtualProbe
WM8Zi-CBL-DE-EMBED - Cable De-Embedding Option for WaveMaster 8 Zi Series Oscilloscopes, Serial Data Analyzers, and Disk Driver Analyzers
WM8ZI-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WM8ZI-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WM8Zi-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WM8Zi-EYEDRII-VP - Bundle - EyeDrII and VirtualProbe Toolkits
WM8Zi-SDAIII - Single-Lane Serial Data Analysis Framework, Eye and Jitter Measurements
WM8Zi-SDAIII-CompleteLinQ - Bundle - Multi-Lane SDA LinQ Framewk, incl. Eye, Jitter, Noise, Xtalk Meas, w/EyeDrII & VirtualProbe
WM8Zi-SDM - Serial Data Mask Software Package for WaveMaster 8 Zi Series
WM8Zi-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WaveMaster 8000HD
WM8KHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WM8KHD-CBL-DE-EMBED - Cable De-Embedding Option for WaveMaster/SDA 8000HD
WM8KHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WM8KHD-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
WM8KHD-SDAX-DP - SDA Expert Technology Framework for DisplayPort
WM8KHD-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WM8KHD-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WM8KHD-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
WM8KHD-SDAX-PCIE6 - SDA Expert Technology Framework for PCIe 6
WM8KHD-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
WM8KHD-SDAX-USB4-TBT - SDA Expert Technology Framework for USB4 and Thunderbolt 3
LabMaster 10 Zi-A Oscilloscopes
LM10Zi-SDAIII-PCIE6 - PCIe 6.0 Transmitter Measurements
LM10ZI-SDAX-PCIE6 - SDA Expert Technology Framework for PCIe 6
LM10ZI-SDAX-USB4-TBT - SDA Expert Technology Framework for USB4 and Thunderbolt 3
LM10ZI-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
LM10ZI-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
LM10ZI-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
LM10Zi-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements
LM10ZI-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
LM10ZI-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
LM10Zi-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
LM10Zi-CBL-DE-EMBED - Cable De-embedding Option for LabMaster 10 Zi Series
LM10Zi-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
LM10Zi-EYEDRII-VP - Bundle - EyeDrII and VirtualProbe Toolkits
LM10Zi-SDAIII - Single-Lane Serial Data Analysis Framework, Eye and Jitter Measurements
LM10Zi-SDAIII-CompleteLinQ - Bundle - Multi-Lane SDA LinQ Framewk, incl. Eye, Jitter, Noise, Xtalk Meas, w/EyeDrII & VirtualProbe
LM10Zi-SDM - Serial Data Mask Software Package for LabMaster 10 Zi Series

When it comes to serial data testing, LeCroy oscilloscopes and analyzers lead the way in providing optimum solutions for high-speed signal and data analysis. In offering a complete toolbox for the busy test and measurement engineer, LeCroy devices provide the ultimate end-to-end solution for the design cycle. From physical layer measurement to expert protocol testing for the message layer, LeCroy’s unique hardware and software architecture ensure superior performance, excellent value, and the fastest time-to-market.

Leading Features

Software clock recovery eliminates trigger jitter

Measure data rates up to 3.5 Gb/s

Automatic mask alignment

Adjustable mask margins

Creation of user-defined masks

Eye pattern of FC1063 optical signal
The SDM serial data mask package for LeCroy WaveMaster series, WavePro 7000 series, WaveRunner 6000 and 6000A series and VBA adds eye pattern mask testing capability to the instrument. The user selects compliance masks from a comprehensive list of standards and the eye pattern is tested against this mask. User-defined masks are also possible by simply editing the included Microsoft™ Access2000™ data base file. The eye pattern is automatically aligned with the compliance mask.

The SDM package measures eye patterns by acquiring a long record of waveform data from the data stream under test. Once in the oscilloscope’s memory, a software algorithm computes a reference clock from the signal data which tracks the long-term variations in the data rate in the same way as a “golden” PLL does in hardware. The loop bandwidth of this software golden PLL is adjustable as a ratio of the measured bit rate. This ratio is variable from 1/20 to 1/10,000. Mask violations are counted and indicated by red circles in the display. The mask margins are adjustable both vertically and horizontally.

All of the data for the eye pattern are collected in a single acquisition thus completely eliminating any trigger jitter from the measurement.

SDM – Serial Data Mask Software Technical Specifications

Software Clock Recovery

PLL bandwidth:  .05 to 10-5 of thedata rate 
Jitter:  1ps RMS typical (based on the WaveMaster sampling clock stability)
Data rates:  Less than 3.5Gb/s

Standard Masks

SONET/SDH
OC1/STM0
OC3/STM1
OC12/STM4
OC48/STM16
Ethernet IEEE Std. 802.3 and ANSI X3.263-1995
1000base-SX short wave optical
1000 base-LX long wave optical 
Fibre Channel electrical 
FC133E, FC266E,FC531E,FC1063E
Fibre Channel optical
FC1063
IEEE1394b (draft)
S400 Optical 
S400b T1
S400b T2
S800 Optical
S800b T1
S800b T2
S1600 Optical
S1600b T1
S1600b T2
Serial ATA (draft) 
G1, G1 Rx, G1 Tx
G2, G2 Rx, G2 Tx
DVI (rev. 1.0)
Transmit normalized, 
Receiver Low/high
Infiniband (draft) 
2.5Gb/s Optical 
2.5 Gb/s Electrical 

WPZi-SDM