- Complete set of comprehensive signal analysis tools
- Expanded histogram functions
- Enhanced FFT capabilities
- Track graphs of any measurement parameter
- Trend up to 1 million events
- Persistence Functions
- Parameter math – add, subtract, multiply or divide two different parameters
- Auto-correlation function
- Cubic, Linear, and Sin X/X interpolation functions
- Narrow-band power measurements
- Sparse function
- Up to 8 different math functions
LeCroy Oscilloscopes offer measurement and analysis capabilities that help you to solve your complicated design problems. Along with LeCroy’s X-Stream architecture that yields fast update results of one measurement or a chain of operations, LeCroy offers many advanced software options to target your specific applications. With 8 unique display areas, you can view signals, analyzed functions, measurements, histograms and statistics all at the same time, giving you the ultimate view of what is happening in your circuit.
Advanced Math Capability
The XMATH Advanced Math Package for LeCroy XStream Oscilloscopes provides a comprehensive set of signal WaveShape Analysis tools that provide insight into the shape of complex signals. XMATH includes expanded histogram functions, Trend and Track, enhanced FFT capabilities, and Parameter math. XMATH lets you perform these operations over the whole signal, whether 250 points or 100 million waveform points.
Fast Fourier Transform (FFT)
XMATH coupled with LeCroy’s X-Stream architecture includes enhanced FFT capabilities which allow you to do an FFT on up to 50M input points and with 5 different windows. For frequency power at a given point, XMATH provides narrow power measurements. The FFT function’s display of the frequency content of your signal will give you insight into potential problems within your circuit. LeCroy’s Math on Zoom capability lets you single out roblem areas of your signal and analyze the frequency content while seeing the live measure result updating on the screen.
An understanding of statistical variations in parameter values tells you about the range or variation of a measurement. A well controlled design will have a narrow mean and distribution of measurements. Often, knowing the average, minimum, maximum, and standard deviation of the parameter may be enough, but a more detailed understanding of the distribution of a parameter’s values can help an engineer locate anomalous behavior in a design.
A parameter is a numerical result calculated on a signal. XMATH allows you to do math on Parameters. You Can Add, Subtract, Multiply, or divide two different parameters to extend the abilities of the scope. For example, you are able to take a measurement of the voltage of a signal and divide that by the current of the signal to find the resistance. With XMATH the result can be renamed and it displays live on the screen.
XMATH includes the ability to further process persistence waveform data. For example, by creating a new trace as the mean of a persistence waveform you are able to analyze the data using the parameters on the oscilloscope.
XMATH also gives you over 20 more parameters. For example, with the Trend function you are able to trend up to 1 million events. Another example is the Auto-Correlation function which will help separate your periodic signal from noise. All of these tools are designed to help engineers efficiently analyze and ensure the integrity of their design.