- Read/Write burst separation with a push of a button
- Simultaneous analysis of four different measurement scenarios
- View up to 10 eye diagrams with mask testing and eye measurements
- Perform jitter analysis for root cause analysis
- Quickly configure measurements specific to DDR
- Analyze specific regions of bursts with configurable qualifiers
- Support for DDR2/3/4 and LPDDR2/3
- Select standard and custom speed grades
Read/Write Bursts Separation
Automatically separate Read and Write bursts with the DDR Debug Toolkit, eliminating the time consuming process of manual burst identification and simplifying the analysis of DDR system performance and validation.
View Up to 10 Eye Diagrams Simultaneously
The DDR Debug Toolkit can quickly create and display up to 10 eye diagrams simultaneously with a push of a button. Visual inspection and analysis of side-by-side eye diagrams can provide valuable skew and timing information. Choosing to have CK or DQS as the timing reference provides two different vantage points of system performance.
Eye Diagram Analysis
Using the DDR Debug Toolkit any DQ, DQS or address signal can be tested against a standard or a custom defined mask. Enabling mask failure indicators will automatically identify any mask violations. Built-in measurements such as eye height, eye width and eye opening are critical to gaining a quantitative understanding of the system performance. With simultaneous eye measurements it is easy to compare performance across multiple testing scenarios.
DDR Jitter Analysis
Bursted DDR signals create undesirable complications and challenges for traditional serial data analysis and jitter tools preventing analysis of DQ, DQS and address signals. Jitter parameters including Tj, Rj, and Dj are calculated across all active DDR measurement scenarios. To gain a deeper understanding of the jitter distribution, traditional displays such as TIE histograms, TIE track, and bathtub curves are available.
With a toolbox of parameters specific to DDR it is simple to quickly configure insightful measurements for validation, characterization, and debug. Up to 12 configurable measurements can be displayed and analyzed simultaneously across all active measurement scenarios. For each measurement, advanced statistics such as min, max, mean, and number of measurement instances can be displayed.
Four Measurement Scenarios
When configuring a measurement scenario each scenario can be independently assigned a signal to be analyzed, providing extensive flexibility for analysis. For example, it is simple to setup a comparison of system performance between read and write burst operation across multiple DQ lanes. Simultaneous analysis of up to four measurement scenarios simplifies the measurement process and eliminates concerns about making unsynchronized measurements.
Reference Scenario for Optimization Testing
The Reference Scenario allows engineers to easily conduct performance tuning or optimization tests. The user is able to store any measurement scenario into a reference scenario, then make a change to their setup to observe a change in any performance characteristics. Measurements can be added or removed from the reference scenario at any time so there is no need to worry about having all analysis parameters defined at the beginning of testing.
Analyze Isolated Regions of Bursts
Using built-in configurable qualifiers, all of the analysis in the DDR Debug Toolkit can be gated to include or ignore the first “n” bits. This allows for a deep understanding of how the system is performing under specific conditions. For example, this type of analysis can be used to gain knowledge about how the system is functioning coming out of preamble or exclusively in the middle of burst operation.