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LeCroy Announces SuperSpeed USB Receiver Tolerance Testing Solution

Chestnut Ridge, NY, August 3, 2009 - LeCroy Corporation, a worldwide leader in serial data test solutions, today announced comprehensive support for USB 3.0 (SuperSpeed USB) receiver tolerance testing using the LeCroy PeRT3 TM (protocol-enabled receiver and transmitter tolerance tester) Test System. Because the PeRT3 System combines the functions and features of a signal generator, bit error rate tester (BERT), protocol editor and serial data analysis system into one instrument, it is able to provide SuperSpeed USB developers with powerful, focused test suites that ensure receiver compliance as defined in the Universal Serial Bus 3.0 Specification. The PeRT3 system’s all-in-one approach greatly simplifies test setup and cabling, provides unprecedented integration of test results, and can perform fully automated tests at the physical or protocol level while managing device and protocol issues that disrupt other test systems.

For instance, the PeRT3 can control the device under test by commanding the device to enter or exit loopback mode, and easily manages issues such as the insertion or deletion of SKP symbols without losing lock during automated testing programs. PeRT3 is the only tool that can recognize SKP symbols and correctly measure BER (bit error rate). In addition, it has the ability to fully characterize the receiver tolerance envelope through the controlled introduction of various types and levels of signal stress (e.g., increased jitter) while monitoring signal integrity. These features and many similar protocol-enabled capabilities provide comprehensive and fully automated testing for faster, easier SuperSpeed USB design.

The key performance upgrade of SuperSpeed USB is an increase in the data rate from 480 Mb/s to 5 Gb/s—ten times faster than USB 2.0. SuperSpeed USB achieves these higher data rates by adapting many proven PCI Express® 2.0 technologies, such as 5 Gb/s, 8b/10b encoding, linear feedback shift register (LFSR), data scrambling and spread spectrum clocking (SSC). LeCroy’s leadership in PCI Express 2.0 compliance testing provides USB developers with the assurance of test tools that are well designed and field tested for the extreme data rates of SuperSpeed USB applications.

Engineers and technicians who would like to know more can contact LeCroy at 1-800-5LeCroy (1-800-553-2769) or visit www.lecroy.com .

About LeCroy

LeCroy Corporation is a worldwide leader in serial data test solutions, creating advanced instruments that drive product innovation by quickly measuring, analyzing, and verifying complex electronic signals. The Company offers highperformance oscilloscopes, serial data analyzers, and global communications protocol test solutions used by design engineers in the computer and semiconductor, data storage device, automotive and industrial, and military and aerospace markets. LeCroy’s 40-year heritage of technical innovation is the foundation for its recognized leadership in “WaveShape Analysis”—capturing, viewing, and measuring the high-speed signals that drive today's information and communications technologies. LeCroy is headquartered in Chestnut Ridge, New York. Company information is available at http://www.lecroy.com.

© 2009 by LeCroy Corporation. All rights reserved. Specifications are subject to change without notice.