Technical Library

Technical Library

The Application Notes section of the Teledyne LeCroy Technical Library lets you search for, browse, and print the latest technical documentation. A search aid allows you to filter documents by category or keyword.

Application Notes on this site are available in PDF format for easy download.

Application Notes

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Oscilloscope Network Security

Recommendations for improving the security of networked Teledyne LeCroy Windows-based oscilloscopes.

PCIe 4.0 Error Detection Using a BERT and Oscilloscope

This application note shows how to combine a BERT and an oscilloscope to create a bit error "flag" that shows the location of PCI Express 4.0 bit errors in real time.

When to Use Tracks and When to Use Trends to Graph Oscilloscope Measurements

This application note compares and contrasts the uses of Track and Trend graphs when making oscilloscope measurements.

Configuring Dynamic Oscilloscope Measurements Using Advanced Customization (XDEV)

This application note outlines the process for configuring a dynamic measurement in which one parameter updates dynamically based on the result of another measurement parameter. By using the Advanced Customization (XDEV) software option on a Teledyne LeCroy oscilloscope, you can seamlessly and continuously provide the output of one parameter to the input of another parameter.

A Robust Method for Measuring Clock Jitter

This tutorial demonstrates a method for measuring clock jitter that includes tests of the oscilloscope timebase to ensure the absolute accuracy of the measurement.

PD 3.1 "Fast Role Swap" Compliance Tests

Overview of the PD 3.1 Fast Role Swap test implementation for the Voyager M310e system.

Measuring PCIe L1 Substate Timing with CrossSync PHY for PCIe

This application note describes how to use CrossSync PHY software with an oscilloscope and protocol analyzer to measure PCIe L1 substate timing and power consumption. It covers topics including triggering, probing, and setting up math traces.