Teledyne LeCroy offers the widest range and fullest-featured set of serial data debug tools for embedded computing, in-vehicle network, industrial, avionic, sideband/peripheral signals, power management and other applications. Teledyne LeCroy's Trigger (T), Decode (D), Measure (M) or Graph (G), and Eye Diagram (E) or Physical Layer (P) options are most often unique or the best available.

  • Highest performance and capability triggers
  • The most intuitive serial data decoder
  • Measure and graph tools for validation efficiency
  • Eye diagrams and parameters for physical layer testing
TDME DatasheetVideosTechnical Docs
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Embedded
Computing		 Automotive +
Industrial		 Avionics Peripherals Power Management MIPI Other
I²C 10Base-T1S ARINC-429 DisplayPort-AUX SPMI I3C AudioBus
SPI 100Base-T1 MIL-STD-1553 USB 2.0 SMBus DPHY Manchester
QSPI 1000Base-T1 SpaceWire USB-PD PMBus DigRF 3G NRZ
UART-RS232 CAN & CAN FD DigRF 4G
CAN XL
LIN
FLEXRAY
SENT

Highest Performance Triggers

Designed by people who know the standards, with the unique capabilities you need to isolate unusual events.

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Powerful, Flexible, Unique

  • Use digital (MSO) inputs, or EXT input for clock line
  • Highly adaptable error frame triggering
  • Unique - EEPROM trigger, transaction definitions, etc.
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Conditional Data Setup

  • <, ≤, =, >, ≥, <>, inside/outside range data condition setup
  • Easily monitor for abnormal events
  • Isolate data in very long byte streams to specific bit locations
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Support for Proprietary Protocols

  • Define "message frame" for proprietary standards
  • Isolate any byte value for ID or DATA triggering
  • Your internal standard can have a customized serial trigger

The Best Serial Decoder

Decoded protocol information is color-coded and transparently overlaid for an intuitive, easy-to-understand visual record with a single time-interleaved table with touch to zoom.

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Intuitive, Color-coded Overlays

  • Color-coding for specific portions of protocol and message frame
  • Overlaid directly on waveform
  • Overlay automatically adjusts as acquisition length changes
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Pattern Search

  • Search using a variety of criteria and values
  • Creates separate zoom trace of searched record
  • Displays searched record with context in full acquisition
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Interactive Table Summarizes Results

  • Tabular display
  • Customizable – show only the information of interest
  • Touch a message to automatically zoom to it
  • Exportable

Measure and Graph Tools for Validation Efficiency

Automated timing measurements quickly validate cause and effect and serial data digital-to-analog (DAC) converter enhances understanding.

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Automated Timing Measurements

  • Measure time between serial messages or serial messages and analog signals
  • Automated for efficiency
  • Ideal for gateway latency or I/O response measurements
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Serial Data DAC and Graphing Tools

  • Time-correlated value vs. time waveforms
  • Extract data and convert it to a scaled analog value
  • Convert units to over 70 units of measure
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Bus Status Measurements

  • Bus utilization and bit rate (clock) stability
  • Bus load % measurement
  • Number of messages in an acquisition
  • Message bit rate

Eye Diagrams and Physical Layer Testing

Rapidly display an eye diagram of low-speed serial data signals. Eye parameters quantify system performance, and eye masks identify anomalies.

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Up to 4 Simultaneous Eye Diagrams

  • Apply filters to limit messages allowed in eye diagrams
  • Quickly correlate protocol and physical layer problems
  • Gain fast understanding of underlying bus signal quality
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Eye Measurements and Masks

  • Measure eye height and width
  • Mask objectively evaluate signal intrusions into eye opening
  • Mask failures indicated with a red circle and displayed in a table
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Advanced PHY Measurements

  • Additional, specialized, standard-specific capabilities
  • Especially useful for serial data standards with higher speed or nodal complexity (e.g., FlexRay, MIPI D-PHY)

Videos

 
 
 
 
 
 
 
 

Technical Docs

On-Demand Webinars

Debug Embedded Systems with Your Oscilloscope – Part 3: Real-world Examples
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USB Type-C® Technologies Webinar Series – Part 1: Introduction to USB Type-C Technologies Physical Layer Testing
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