Oscilloscope Probes


Probe Deskew and Calibration Fixture

    Differential Probes (13-25 GHz)

D1305-A-PS - 13 GHz Complete Probe System with Solder-In Tip (13 GHz) and Positioner Tip Browser (13 GHz)
D1605-A-PS - 16 GHz Complete Probe System with Solder-In Tip (16 GHz) and Positioner Tip Browser (16 GHz)
D2005-A-PS - 20 GHz Complete Probe System with Solder-In Tip (20 GHz) and Positioner Tip Browser (20 GHz)
D2505-A-PS - 25 GHz Complete Probe System with Solder-In Tip (25 GHz) and Positioner Tip Browser (22 GHz)
D1305-A - WaveLink D1305 13 GHz/2.0Vp-p Differential Probe Amplifier with Dxx05-SI Solder-In Tip (Qty. 2)
D1605-A - WaveLink D1605-A 16 GHz/2.0Vp-p Differential Probe Amplifier with Dxx05-SI Solder-In Tip (Qty. 2)
D2005-A - WaveLink D2005-A 20 GHz/2.0Vp-p Differential Probe Amplifier with Dxx05-SI Solder-In Tip (Qty. 2)
D2505-A - WaveLink D2505-A 25 GHz/2.0Vp-p Differential Probe Amplifier with Dxx05-SI Solder-In Tip (Qty. 2)
WL-PLINK-A-CASE - WaveLink ProLink Platform/Cable Assembly Kit for Dxx05-A 13-20 GHz WaveLink Probes.
WL-2.92MM-CASE - WaveLink 2.92mm Platform/Cable Assembly Kit for D2505-A 25 GHz WaveLink Probes.
Dxx05-PT-KIT - WaveLink Dxx05-PT (up to 22 GHz rating) Adj. Positioner Tip Kit.For use with Dxx05-A amplifiers.
DXX05-SI - Replacement Dxx05-SI 13-25 GHz Solder-In Lead with Qty. 5 Spare Resistors.
LPA-2.92 - ProLink to 2.92mm Adapter with Probe Power and Communication Pass Through
D1305-A-CCNIST - NIST Calibration for D1305-A. Includes test data.
D1605-A-CCNIST - NIST Calibration for D1605-A. Includes test data.
D2005-A-CCNIST - NIST Calibration for D2005-A. Includes test data.
D2505-A-CCNIST - NIST Calibration for D2505-A. Includes test data.
EZ Probe - Cascade Microtech EZ-Probe Positioner
TF-DSQ - Probe Deskew and Calibration Test Fixture Limited Availability
Key Features
  • Choice of 13, 16, 20 and 25 GHz bandwidth models
    • Bandwidth rating is for probe + oscilloscope combined
    • Optimized probe + oscilloscope performance, automatically
  • 2.0Vpk-pk dynamic range
  • ±2.5V offset range
  • Probe System (-PS models) provide complete capability
  • Deluxe soft carrying case
  • Long-length solder-in tip with field replaceable resistors
  • Carbon-composite browser tips optimize signal fidelity and loading
  • Superior probe impedance for minimized loading
  • Probe noise as low as 14 nV/√Hz


WaveLink High Bandwidth (13-25) GHz Differential Probes

Teledyne LeCroy's WaveLink 13-25 GHz Differential Probes are a high bandwidth, high performance probe solution with large dynamic and offset range and very low noise

Complete Probe System

A value-priced, comprehensive bundle of all items including differential amplifier, solder-in tips (qty. 2) and positioner (browser) tip (qty. 1), platform/cable assembly, assorted interconnect parts, mounting devices, and other accessories, and a deluxe soft carrying case to hold all items. This makes selection as easy as simply choosing the bandwidth that you require.

High Dynamic Range and Offset

Exceptionally high dynamic range (2.0Vpk-pk) at high bandwidths (up to 25 GHz) and large offset capability as well.

Deluxe Soft Carrying Case

A deluxe soft carrying case conveniently holds all components of the probe system

High-Performance Solder-in Tip

Long-length solder-in tip with field replaceable resistors. External tip resistors locate the tip resistance as close to the point of contact as possible to minimize circuit loading.

Carbon-composite Browser Tips Maximize Signal Fidelity

Carbon fiber composite pogo-pin resistive tips used in the positioner tip locate an ideal distributed resistance at the point of contact. This design is unique to Teledyne LeCroy and provides improved signal fidelity.

Superior Probe Impedance

Circuit and signal loading is reduced by more than 50% compared to other high bandwidth probes. This greatly reduces measurement impact.

Leading Features
  • Deskews to +/– 20 ps typical accuracy
  • Differential and single-ended drive
  • 75 ps edge for precise deskewing
  • Calibrates gain, offset and skew at same probing point
  • Accounts for risetime variations
  • Accounts for common-mode voltage variations
  • DC gain calibration accounts for probe loading effects
  • Integrated operation with scope for fully automatic calibration

Probe Deskew and Calibration
The TF-DSQ fixture provides industry leading probe deskew and calibration capability. High-end scopes and probes are used to make important measurements where extreme precision is required.

Probes present unique problems when utilized for high-speed measurements. The most important problem is that of differences in delay through the probe cable. When multiple probes are utilized for high-speed timing measurements, differences in the delay through the probe cable must be accounted for and calibrated out. Similarly, the gain and offset must be calibrated for proper measurement results. Nothing is more frustrating than spending the time and effort connecting a set of probes to a circuit and realizing that the probes have not been properly calibrated. For this reason, the TF-DSQ fixture and software are designed in a manner that requires one connection of the probe to the fixture and one button press producing probe calibration results that are valid for the duration that the probe is connected to the circuit.

Probe Deskew
TF-DSQ provides an extremely fast edge with 75 ps risetime.When a probe is connected to the fixture and deskewed, this fast risetime provides a typical edge timing accuracy of +/– 20 ps. Risetime correction is provided by entering the measured risetime of the signals being measured.The scope software makes adjustments to the measured deskew amounts to account for risetime variations.

Probe Gain and Offset Calibration
TF-DSQ provides DC levels to a probe to calibrate the probe for gain and offset over all voltage ranges.To account for probe loading, the TF-DSQ fixture measures the voltage applied to the probe tips to calibrate out any probe loading effects and to improve DC measurement accuracy.

Calibrates Single-ended and Differential Probes
TF-DSQ calibrates single-ended and differential probes in the exact configuration that they are used. Single-ended probes are calibrated using a ground reference and differential probes are calibrated differentially. When probing accessories are utilized for connection to the circuit, such as solder-in adapters, the soldered leads are connected to the fixture via a clamp that fixes the leads to the calibration point. In the case of differential probe calibration, a common mode voltage can be specified so that the differential gain and offset is calibrated with the common mode component for increased probing accuracy.