Technical Library

On Demand Webinars

Browse these recorded webinars presented by Teledyne LeCroy technical experts.

Nov 14 ,2014
Testing and Qualifying SAS 12 Gb/s SSDs
Presented by Mike Micheletti, Teledyne LeCroy PSG Product Manager Storage and Peter Lizak, Teledyne LeCroy PSG Senior Applications Engineer
Nov 12 ,2014
Eliminate DDR Measurement Pitfalls

Presented by Mike Hertz, Sr. Field Applications Engineer, Teledyne LeCroy

Nov 5 ,2014
USB 3.0 Compliance and a look ahead to USB 3.1
The USB Implementers Forum (USB-IF) requires that all USB products meet the criteria established by the USB-IF Compliance Program for eligibility to bear the USB-IF logo. As an official test partner for Link Layer certification, Teledyne LeCroy USB protocol analyzers, exercisers, and compliance test software, play an important role in this process.
Oct 8 ,2014
Identifying PCIe 3.0 Dynamic Equalization Problems
Sep 9 ,2014
Essential Principles of Jitter Part 3: Practical Jitter Measurements
Sep 4 ,2014
Using an Optical Modulation Analyzer to Optimize 16QAM Optical Tranceivers

Presented by Dr. Alan Blankman of Teledyne LeCroy and Dr. SungHoon Im of Coherent Solutions

Aug 22 ,2014
PCI Express Storage Webinar

This seminar will discuss the reasoning behind the move to PCI Express based storage and the advantages of doing so. The seminar will also provide an overview of PCI Express and how it is used as a transport for storage protocols. Real world examples will be used to demonstrate techniques for debugging PCI Express based storage technologies.

Jul 24 ,2014
Generation Acquisition and Analysis of PAM4 and 16QAM Signals

In this joint webcast from Teledyne LeCroy, Anritsu and Coherent Solutions, you will learn about the latest advances in PAM4 signal generation and analysis.

Jul 8 ,2014
Essential Principles of Jitter Part 2: The Components of Jitter

Presented by Dr. Alan Blankman and Dr. Eric Bogatin 

Jun 4 ,2014
Back to Basics: Oscilloscope Fundamentals

Presented by Howard Williams, Field Applications Engineer, Teledyne LeCroy

May 7 ,2014
Essentials of Jitter Analysis Part 1: The Time Interval Error

Presented by Dr. Alan Blankman and Dr. Eric Bogatin

Apr 16 ,2014
Insights from S-Parameters
Presented by Stephen Mueller, Field Applications Engineer
Dec 4 ,2013
Testing and qualifying DDR4 for JEDEC Compliance
Presented by Mike Micheletti, Product Manager, & Robert Mart, Technical Marketing Engineer, Teledyne LeCroy
Jun 12 ,2013
Understanding and Testing DDR4 RDIMM and LRDIMM Technology
- Presented by Mike Micheletti, Product Manager - Teledyne LeCroy; & Douglas Malich. Product Markting Manager - IDT
Dec 15 ,2011 
Circuit Validation Using 12-bit ADC's in Wide-Bandwidth Digital Oscilloscopes
Nov 9 ,2011
Embedded Systems - Messen, Triggern und Decodieren mit dem Oszilloskop
Oct 27 ,2011
Oszilloskop Basics – Was mein digitales Oszilloskop wirklich alles kann