Vector Network Analyzer (VNA) + Time Domain Reflectometer (TDR) Capabilities

WavePulser 40iX High-speed Interconnect Analyzer provides unmatched characterization insight into both frequency and time domains with a single acquisition.

  • Measures S-parameters (like a VNA)
  • Measures impedance profile (like a TDR)
  • Advanced de-embedding to IEEE 370-2020 Standard
  • Emulation and simulation of high-speed serial data channels
  • No calibration required
  • Costs a fraction of the price of a VNA
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WavePulser 40iX high-speed interconnect analyzer performing vector network analyzer (VNA) s-parameter measurements, such as return loss and insertion loss measurements, on a circuit board

Unmatched Characterization Insight

Representative plot of mixed-mode and return and insertion loss S-parameters

S‑parameter Measurements

Get a complete characterization of the signal path in one acquisition:

  • Frequency range DC to 40 GHz
  • Single-ended and mixed-mode S‑parameters
  • Measure return loss, insertion loss
  • Internal, automatic calibration saves time and trouble
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Representative plot of impedance profile generated using a time domain reflectometer (TDR) to measure time domain transmission (TDT)

Impedance Profile Measurements

Precisely locate impairments in the circuit:

  • Impedance profile spatial resolution < 1 mm
  • Differential and common-mode impedance profiles
  • TDR and TDT capability
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Icongraphy describing the WavePulser 40iX High-speed Interconnect Analyzer’s capabilities to perform de-embedding using S-parameters and measure jitter and eye diagrams

De-embedding (IEEE 370-2020), Simulation, Emulation

WavePulser 40iX software provides easy analysis and modeling of interconnects and circuits with its deep toolbox:

  • Support for 2x-Thru, 1x-Reflect-Short, 1x-Reflect-Open
  • Support for in-situ de-embedding (ISD) - 2x-Thru with gating
  • Eye diagram with equalized emulation and advanced jitter analysis
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Test in Both Frequency and Time Domains

WavePulser 40iX High-speed Interconnect Analyzer is the ideal, single measurement tool for high-speed hardware designers and test engineers, with all the features and capabilities that vector network analyzers (VNA) and time domain reflectometers (TDR) lack. Make one acquisition, then measure in both frequency and time domains.

Iconography describing how the WavePulser 40iX can measure in both the time domain (impedance profiles, like a time domain reflectometer) and frequency domain (S-parameters, like a vector network analyzer) and perform de-embedding for jitter and eye diagram analysis

Designed for high-speed interconnect analysis

WavePulser 40iX validates, debugs and troubleshoots interconnectivity issues in serial data cables, channels, connectors, vias, backplanes, printed-circuit boards, and chip and SoC packages. It is simple to set up and use. It provides the same results as a network analyzer for a fraction of the price.

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Internal, automatic calibration

WavePulser 40iX calibration standards are built-in, so calibration is always automated, simple and fast. Compare to a vector network analyzer that requires purchase of additional, external calibration standards and requires manual connection for calibration. The TDR/TDT-based approach is also independent of setup, making calibration less frequent.

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Full range DC to 40 GHz

WavePulser 40iX delivers time domain reflectometer (TDR) step response and time-gated and/or emulated physical-layer responses with no need for extrapolation to DC and low frequencies - ideal for high-speed serial data interconnect analysis.

On-Demand Webinars

What Do I Need and Why - TDR, S-parameters, or Both?
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S-Parameter Master Class Part 3 - Hands on Lab
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S-Parameter Master Class Part 2 - Hands on Lab
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S-Parameter Master Class Part 1 - Hands on Lab
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Beyond the TDR
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How to Read S-parameters Like a Book
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Lossy Interconnects and Insertion Loss
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Mixed mode S-parameters and TDR responses
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Principles of De-embedding
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Using S-parameters as a Behavioral Model in System Simulation
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S‑parameters Measurements

WavePulser 40iX High-speed Interconnect Analyzer measures both single-ended and mixed-mode S‑parameters from one acquisition. Change settings and recalculate results without having to reacquire new data.

Screen image showing a single-acquisition with all mixed-mode s-parameters, return, and insertion losses for all port

Mixed-mode S‑parameters Measurements

One acquisition displays all measurement results: mixed-mode return and insertion losses for all ports; differential-mode and common-mode measurements; DC frequency response. A tabular graphical user interface makes reading results straightforward.

Simple and Flexible Network Analysis Setup

A simple setup requires you to enter only frequencies and number of ports for a single-ended acquisition. Choose a test time optimized for accuracy or speed or something in between. Reconfigure ports in software without reconnecting to the DUT. Reorder S-parameters in the Touchstone file.

Higher Accuracy with Internal Calibration

Internal, electronic calibration permits measurements to begin sooner and be made with more confidence. Capabilities such as passivity, reciprocity and causality enforcement ensure higher S‑parameters measurement accuracy.

Impedance Profile Measurements

WavePulser 40iX High-speed Interconnect Analyzer measures impedance profiles with < 1 mm spatial resolution.

Screen image showing an impedance profile (Z0 vs electrical length) for a high-speed serial data interconnect

Multiple Impedance Profile Views

WavePulser 40iX supports both differential-mode impedance profile and mixed-mode measurements and can display multiple modes simultaneously. View step-response, pulse-response and reflection coefficient, as well.

Precisely Locate Impairments

Use impedance profiles to detect and locate common problems in high-speed serial data interconnects: improperly tightened connectors; damaged cables; incorrect cable-bend radiuses; defective vias on transmissions lines; other transmission line irregularities.

Optimize Efficiency

Impedance profiles detect and locate impairments in the measurement setup, not just on the DUT, helping you work more efficiently. Understand when it is necessary to repeat calibration, and when it is not.

De-embedding, Simulation, Emulation and Jitter Analysis

WavePulser 40iX High-speed Interconnect Analyzer can be purchased bundled with SI Studio (WavePulser-40iX-BUNDLE), a deep analysis toolbox tailored to understanding high-speed serial data interconnect characteristics. NRZ signal analysis is included as standard with the purchase of WavePulser-40iX-BUNDLE. WAVEPULSER-SISTUDIO-UPG-PAM can be purchased to add PAM3 and PAM4 signal analysis capability to SI Studio

Screen image showing time-gating, impedance peeling, and de-embedding using S-parameters for jitter and eye diagram analysis of a high-speed serial data interconnect

Advanced De-embedding to IEEE 370-2020 Standard

Eliminate the effects of test fixtures, cables and connectors per the IEEE 370-2020 standard and improve measurement accuracy. Supports 2x-Thru, 1x-Reflect-Short, 1x-Reflect-Open methods, and in-situ de-embedding (ISD) using TDR-based impedance peeling or port extension. Use resultant S-parameters in Eye Diagram and Jitter Analysis tools. (Some capabilities optional).

Fast Eye Diagram Views

Import or simulate waveforms and use S‑parameters to model impairments. Quickly view the impact of impairments with an intuitive serial data eye diagram. View the effects of de‑embedding and equalization on the eye diagram. Supports PLL, pre‑emphasis, de‑emphasis, CTLE, FFE and DFE.

Advanced Jitter Analysis

Measure total (Tj), random (Rj) and deterministic (Dj) jitter. De-convolve Dj into component parts. View jitter in spectral, histogram, jitter track, eye diagram and other plots.

Comprehensive IEEE 370-2020 Algorithm Support Increases Measurement Accuracy

1x-Reflect-Short and 1x-Reflect-Open IEEE 370-2020 Standard test fixture representation

1x-Reflect-Short and 1x-Reflect-Open

  • Ideal for all TDR cable assembly tests
  • Easy‑to‑use impedance‑corrected methods
  • High accuracy with WavePulser 40iX TDR technology
2x-Thru de-embedding per IEEE 370-2020 370-2020 Standard for Electrical Characterization of Printed Circuit Board and Related Interconnects at Frequencies up to 50 GHz

2x-Thru

  • Creates a structure without the DUT presence
  • S-parameters divided into equal halves – Left and Right – for use in de-embedding
  • Works with imported or measured S‑parameter files
2x-Thru with gating using an impedance corrected peeling algorithm, consistent with techniques for in-situ de-embedding (ISD)

2x-Thru with Gating (In-Site De-embedding, or ISD)

  • Ideal for isolating test fixtures from all cables and connectors
  • Enhanced accuracy using impedance corrected peeling algorithms
  • High accuracy with WavePulser 40iX TDR technology

Technical Docs

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