SDAIII

In today and tomorrow’s world of multi-lane signaling, designers of serial data systems require multi-lane analysis. Unleash the power of multi-lane SDA analysis to perform eye and jitter measurements on up to four lanes, simultaneously.

Explore SDAIII

SDAIII-CompleteLinQ In today and tomorrow’s world of multi-lane signaling, designers of serial data systems require multi-lane analysis. Unleash the power of multi-lane SDA analysis to perform eye and jitter measurements on up to four lanes, simultaneously.

VirtualProbe By using VirtualProbe, you can understand the characteristics of signals where a physical probe cannot be placed, such as inside of a package or at the end of an interconnect that doesn't physically exist. You can choose to remove effects caused by elements such as fixtures that are not be present in a production configuration, and also add the effects of a device that is to be included but for which only an S-parameter model exists. Use in conjunction with SDAIII products to complete your serial data analysis solution set.

Simultaneous Analysis of Multiple Lanes

Use multi-lane analysis to simultaneously measure, view and compare eye diagrams and results from up to 4 lanes and/or configurations.

New Vertical Noise and Crosstalk Analysis Package

Gain insight into sources of crosstalk and interference with capabilities that can only be found on Teledyne LeCroy real-time oscilloscopes.

Extended SDA Framework

The SDAIII "framework flow dialog" provides access to all eye, jitter and noise analysis capacities and signal integrity toolkits.

Most Complete Set of Jitter, Eye and Analysis Tools

Access the most complete set of serial data analysis tools to form eye diagrams and decompose jitter into Tj, Rj, Dj and beyond.

Compatibility

SDAIII-CompleteLinQ is compatible WavePro/SDA/DDA 7 Zi/Zi-A, WaveMaster/SDA/DDA 8 Zi/Zi-A, LabMaster 9 Zi-A and 10 Zi series oscilloscopes.