The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox for simulation, emulation, de-embedding and time-gating provides unmatched characterization insight.
Get a complete characterization of the signal path in one acquisition:
Precisely locate impairments in the circuit:
WavePulser measurements are ready for simulation using built-in SI Studio and other tools:
WavePulser 40iX High-speed Interconnect Analyzer is the ideal, single measurement tool for high-speed hardware designers and test engineers, with all the features and capabilities that VNAs and TDRs lack. Make one acquisition, then measure in both frequency and time domains.
WavePulser 40iX validates, debugs and troubleshoots interconnectivity issues in serial data cables, channels, connectors, vias, backplanes, printed-circuit boards, and chip and SoC packages. It is simple to set up and use.
WavePulser 40iX calibration standards are built-in, so calibration is always automated, simple and fast. There is no need to purchase additional, external calibration standards. The TDR/TDT-based approach is independent of setup, making calibration less likely.
WavePulser 40iX delivers TDR step response and time-gated and/or emulated physical-layer responses with no need for extrapolation to DC and low frequencies ideal for interconnection systems.
Dr. Eric Bogatin, "Signal Integrity Evangelist", explains S-parameter and TDR measurements.
WavePulser 40iX High-speed Interconnect Analyzer calculates both single-ended and mixed-mode S-parameters from one acquisition. Just change settings and recalculate results without having to reacquire.
One acquisition displays all measurement results: mixed-mode return and insertion losses for all ports; differential-mode and common-mode measurements; DC frequency response. A tabular graphical user interface makes reading results straightforward.
A simple setup requires you to enter only frequencies and number of ports for a single-ended acquisition. Choose a test time optimized for accuracy or speed or something in between. Reconfigure ports in software without reconnecting to the DUT. Reorder S-parameters in the Touchstone file.
Internal, electronic calibration permits measurements to begin sooner and be made with more confidence. Capabilities such as passivity, reciprocity and causality enforcement ensure higher measurement accuracy.
WavePulser 40iX High-speed Interconnect Analyzer calculates impedance profiles with < 1 mm spatial resolution.
WavePulser 40iX supports both differential-mode and mixed-mode measurements and can display multiple modes simultaneously. View step-response, pulse-response and reflection coefficient, as well.
Use impedance profiles to detect and locate common problems in high-speed interconnects: improperly tightened connectors; damaged cables; incorrect cable-bend radiuses; defective vias on transmissions lines; other transmission line irregularities.
Impedance profiles detect and locate impairments in the measurement setup, not just on the DUT, helping you work more efficiently. Understand when it is necessary to repeat calibration, and when it is not.
WavePulser 40iX High-speed Interconnect Analyzer can be purchased bundled with SI Studio™ (WavePulser-40iX-BUNDLE), a deep analysis toolbox tailored to understanding high-speed interconnect characteristics.
Eliminate the effects of cables and connectors from results. Set gating through port extension or an impedance peeling algorithm, and save S-parameters with or without the gating region. De-embed serial data channels using modeled or measured S-parameters.
Import or simulate waveforms and use S-parameters to model impairments. Quickly view the impact of impairments with an intuitive serial data eye diagram. View the effects of de-embedding and equalization on the eye diagram. Supports PLL, pre-emphasis, de-emphasis, CTLE, FFE and DFE.
Measure total (Tj), random (Rj) and deterministic (Dj) jitter. De-convolve Dj into component parts. View jitter in spectral, histogram, jitter track, eye diagram and other plots.
The WavePulser 40iX offers many de-embedding methods. This technical brief explores these methods and help you obtain the best results.
This paper covers important topics in s-parameter measurements made for signal integrity applications, where the time-domain implications are important.
This brief explains time-domain techniques for de-embedding that are available within the WavePulser 40iX called time gating and impedance peeling.
This paper discusses the three methods of calibration utilized in the WavePulser 40iX including the automatic internal calibration, manual calibration and second-tier calibration.
This paper explains the dynamic range of the Teledyne LeCroy WavePulser 40iX High Speed Interconnect Analyzer and compares it to our previous product, the SPARQ.
The complex relationship between risetime, bandwidth, and temporal and spatial resolution is explored for various types of systems