Unmatched Characterization Insight

The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox for simulation, emulation, de-embedding and time-gating provides unmatched characterization insight of high-speed serial data interconnects, all at a fraction of the price of a vector network analyzer (VNA).

WavePulser 40iX high-speed interconnect analyzer performing vector network analyzer (VNA) s-parameter measurements, such as return loss and insertion loss measurements, on a circuit board
Representative plot of mixed-mode and return and insertion loss S-parameters

S‑parameter Measurements

Get a complete characterization of the signal path in one acquisition:

  • Frequency range DC to 40 GHz
  • Single-ended and mixed-mode S‑parameters
  • Internal, automatic calibration for network analysis measurements
Representative plot of impedance profile generated using a time domain reflectometer (TDR) to measure time domain transmission (TDT)

Impedance Profile Measurements

Precisely locate impairments in the circuit:

  • Impedance profile spatial resolution < 1 mm
  • Differential and common-mode impedance profiles
  • TDR and TDT capability
Icongraphy describing the WavePulser 40iX High-speed Interconnect Analyzer’s capabilities to perform de-embedding using S-parameters and measure jitter and eye diagrams

Deep Toolbox

WavePulser 40iX measurements are ready for simulation using built-in SI Studio and other tools:

  • De-embedding and time-gating
  • Eye diagram with equalized emulation
  • Advanced jitter analysis



Designed for high-speed interconnect analysis

WavePulser 40iX validates, debugs and troubleshoots interconnectivity issues in serial data cables, channels, connectors, vias, backplanes, printed-circuit boards, and chip and SoC packages. It is simple to set up and use. It provides the same results as a network analyzer for a fraction of the price.

Internal, automatic calibration

WavePulser 40iX calibration standards are built-in, so calibration is always automated, simple and fast. Compare to a vector network analyzer that requires purchase of additional, external calibration standards and requires manual connection for calibration. The TDR/TDT-based approach is also independent of setup, making calibration less frequent.

Full range DC to 40 GHz

WavePulser 40iX delivers time domain reflectometer (TDR) step response and time-gated and/or emulated physical-layer responses with no need for extrapolation to DC and low frequencies - ideal for high-speed serial data interconnect analysis.

Mixed-mode S‑parameters Measurements

One acquisition displays all measurement results: mixed-mode return and insertion losses for all ports; differential-mode and common-mode measurements; DC frequency response. A tabular graphical user interface makes reading results straightforward.

Simple and Flexible Network Analysis Setup

A simple setup requires you to enter only frequencies and number of ports for a single-ended acquisition. Choose a test time optimized for accuracy or speed or something in between. Reconfigure ports in software without reconnecting to the DUT. Reorder S-parameters in the Touchstone file.

Higher Accuracy with Internal Calibration

Internal, electronic calibration permits measurements to begin sooner and be made with more confidence. Capabilities such as passivity, reciprocity and causality enforcement ensure higher S‑parameters measurement accuracy.

Multiple Impedance Profile Views

WavePulser 40iX supports both differential-mode impedance profile and mixed-mode measurements and can display multiple modes simultaneously. View step-response, pulse-response and reflection coefficient, as well.

Precisely Locate Impairments

Use impedance profiles to detect and locate common problems in high-speed serial data interconnects: improperly tightened connectors; damaged cables; incorrect cable-bend radiuses; defective vias on transmissions lines; other transmission line irregularities.

Optimize Efficiency

Impedance profiles detect and locate impairments in the measurement setup, not just on the DUT, helping you work more efficiently. Understand when it is necessary to repeat calibration, and when it is not.

Time‑gating and De‑embedding

Eliminate the effects of cables and connectors from results. Set gating through port extension or an impedance peeling algorithm, and save S‑parameters with or without the gating region. De‑embed serial data channels using modeled or measured S‑parameters.

Fast Eye Diagram Views

Import or simulate waveforms and use S‑parameters to model impairments. Quickly view the impact of impairments with an intuitive serial data eye diagram. View the effects of de‑embedding and equalization on the eye diagram. Supports PLL, pre‑emphasis, de‑emphasis, CTLE, FFE and DFE.

Advanced Jitter Analysis

Measure total (Tj), random (Rj) and deterministic (Dj) jitter. De-convolve Dj into component parts. View jitter in spectral, histogram, jitter track, eye diagram and other plots.