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Mixed Signal Test Solutions
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WM8Zi-CBL-DE-EMBED

Cable De-Embed Option (Standard on SDA 8 Zi and DDA 8 Zi)


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    Serial Data Analysis


HDO6000B High Definition Oscilloscopes
HDO6K-SDAX-NRZ - NRZ Serial Data Analysis Framework, Eye,Jitter, Noise and Crosstalk Measurements
HDO6K-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
HDO6K-SDM - Serial Data Mask Software Package for HDO6000
WaveRunner 9000 Oscilloscopes
WR9K-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements for WaveRunner 9000
WR9K-SDAX-NRZ - NRZ Serial Data Analysis Framework, Eye,Jitter, Noise and Crosstalk Measurements
WR9K-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WR9K-EyeDrII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WR9K-SDM - Serial Data Mask Software Package for WaveRunner 9000
WR9K-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WaveRunner 9000
WR9K-CBL-DE-EMBED - Cable De-Embedding Option for WaveRunner 9000
WaveRunner 8000HD 8 Channel High Definition Oscilloscopes
WR8KHD-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WR8KHD-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WR8KHD-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WaveRunner/MDA 8000HD
WR8KHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WR8KHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WR8KHD-SDM - Serial Data Mask Software Package for WaveRunner/MDA 8000HD
WR8KHD-CBL-DE-EMBED - Cable De-Embedding Option for WaveRunner/MDA 8000HD
MDA 8000HD Motor Drive Analyzers
WR8KHD-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WaveRunner/MDA 8000HD
WR8KHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WR8KHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WR8KHD-SDM - Serial Data Mask Software Package for WaveRunner/MDA 8000HD
WR8KHD-CBL-DE-EMBED - Cable De-Embedding Option for WaveRunner/MDA 8000HD
WavePro HD Oscilloscopes
WPHD-CBL-DE-EMBED - Cable De-Embedding Option for WavePro HD
WPHD-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
WPHD-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
WPHD-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
WPHD-SDAX-DP - SDA Expert Technology Framework for DisplayPort
WPHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WPHD-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements for WavePro HD
WPHD-EYEDRII-VP - Bundle - EyeDrII and VirtualProbe Toolkits
WPHD-SDAIII - Single-Lane Serial Data Analysis, Eye and Jitter Measurements for WavePro HD
WPHD-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WPHD-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WPHD-SDAIII-COMPLETELINQ - Multi-Lane SDA LinQ incl. Eye, Jitter, Noise, Xtalk Meas, EyeDrII & VirtualProbe for WavePro HD
WPHD-SDM - Serial Data Mask Software Package for WavePro HD
WPHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WaveMaster / SDA / DDA 8 Zi-B Oscilloscopes
WM8ZI-SDAX-USB4-TBT - SDA Expert Technology Framework for USB4 and Thunderbolt 3
WM8ZI-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
WM8ZI-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
WM8ZI-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
WM8ZI-SDAX-DP - SDA Expert Technology Framework for DisplayPort
WM8Zi-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements for WaveMaster 8 Zi Series
SDA8Zi-CompleteLinQ - Bundle - Multi-Lane SDA LinQ Framewk, incl. Eye, Jitter, Noise, Xtalk Meas, w/EyeDrII & VirtualProbe
WM8Zi-CBL-DE-EMBED - Cable De-Embedding Option for WaveMaster 8 Zi Series Oscilloscopes, Serial Data Analyzers, and Disk Driver Analyzers
WM8ZI-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WM8ZI-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WM8Zi-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WM8Zi-EYEDRII-VP - Bundle - EyeDrII and VirtualProbe Toolkits
WM8Zi-SDAIII - Single-Lane Serial Data Analysis Framework, Eye and Jitter Measurements
WM8Zi-SDAIII-CompleteLinQ - Bundle - Multi-Lane SDA LinQ Framewk, incl. Eye, Jitter, Noise, Xtalk Meas, w/EyeDrII & VirtualProbe
WM8Zi-SDM - Serial Data Mask Software Package for WaveMaster 8 Zi Series
WM8Zi-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WaveMaster 8000HD
WM8KHD-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
WM8KHD-CBL-DE-EMBED - Cable De-Embedding Option for WaveMaster/SDA 8000HD
WM8KHD-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
WM8KHD-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
WM8KHD-SDAX-DP - SDA Expert Technology Framework for DisplayPort
WM8KHD-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
WM8KHD-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
WM8KHD-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
WM8KHD-SDAX-PCIE6 - SDA Expert Technology Framework for PCIe 6
WM8KHD-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
WM8KHD-SDAX-USB4-TBT - SDA Expert Technology Framework for USB4 and Thunderbolt 3
LabMaster 10 Zi-A Oscilloscopes
LM10Zi-SDAIII-PCIE6 - PCIe 6.0 Transmitter Measurements
LM10ZI-SDAX-PCIE6 - SDA Expert Technology Framework for PCIe 6
LM10ZI-SDAX-USB4-TBT - SDA Expert Technology Framework for USB4 and Thunderbolt 3
LM10ZI-SDAX-COMPLETE - Bundle - Multi-Lane SDA Expert Framework, incl. Eye, Jitter, Noise, Xtalk Meas and VirtualProbe
LM10ZI-SDAX-PCIE-NRZ - SDA Expert Technology Framework for PCIe NRZ
LM10ZI-SDAX-USB32 - SDA Expert Technology Framework for USB3.2
LM10Zi-SDAIII-PAMx - PAMx Serial Data Analysis, Eye, Jitter and Noise Measurements
LM10ZI-SDAX-NRZ - NRZ Serial Data Expert Analysis Framework, Eye, Jitter and Noise Measurements
LM10ZI-SDAX-PAM - PAM Serial Data Expert Analysis Framework, Eye,Jitter and Noise Measurements
LM10Zi-VIRTUALPROBE - Advanced De-embedding, Emulation and Virtual Probing Toolkit
LM10Zi-CBL-DE-EMBED - Cable De-embedding Option for LabMaster 10 Zi Series
LM10Zi-EYEDRII - Signal Integrity Toolkit - Channel & Fixture De-embedding/Emulation, Tx/Rx Equalization
LM10Zi-EYEDRII-VP - Bundle - EyeDrII and VirtualProbe Toolkits
LM10Zi-SDAIII - Single-Lane Serial Data Analysis Framework, Eye and Jitter Measurements
LM10Zi-SDAIII-CompleteLinQ - Bundle - Multi-Lane SDA LinQ Framewk, incl. Eye, Jitter, Noise, Xtalk Meas, w/EyeDrII & VirtualProbe
LM10Zi-SDM - Serial Data Mask Software Package for LabMaster 10 Zi Series

When it comes to serial data testing, LeCroy oscilloscopes and analyzers lead the way in providing optimum solutions for high-speed signal and data analysis. In offering a complete toolbox for the busy test and measurement engineer, LeCroy devices provide the ultimate end-to-end solution for the design cycle. From physical layer measurement to expert protocol testing for the message layer, LeCroy’s unique hardware and software architecture ensure superior performance, excellent value, and the fastest time-to-market.

Cable De-embedding

Cable de-embedding is a standard feature on all SDA Zi oscilloscopes and is included with Eye Doctor II. Cable de-embedding gives the user the ability to quickly and easily remove the effect of cables by entering in an attenuation table or attenuation constants that are typically provided by the cable manufacturer.

Adding/Removing Pre- or De-emphasis

Serial data channels have a significant impact on the high frequency content of the serial data signal. Therefore, transmitter designers sometime employ the use of emphasis to pre-compensate for these effects. Eye Doctor II can remove de-emphasis or pre-emphasis from a signal measured at the transmitter output. This is useful when attempting to measure the jitter on such a signal in order to remove the DDj introduced by the de-emphasis. Additionally, Eye Doctor II can add de-emphasis or pre-emphasis to identify the amount necessary to compensate for specific serial data channels.

Cable/Fixture/Serial Data Channel De-embedding

In many typical high frequency measurement situations, engineers desire to connect as directly to their signal as possible and avoid the use of probes. However, even high quality test fixtures, channels, and cables have a negative impact on signal quality that increases with higher signal frequency. While these effects could be ignored at lower frequencies, they should always be accounted for as bit rates increase above 5 Gb/s. If the test fixture, channel, or cable can be electrically quantified in terms of S-parameters using Vector Network Analyzers (VNAs), or Time Domain Reflectometer/Time Domain Transmission (TDR/TDT), then the electrical impact of them can be removed from the measurement result. The result is a measurement that is unaltered by the test setup, and the ability to further measure, apply math, or post-process this true measurement using additional built-in oscilloscope tools, such as parameters, math functions, jitter tracks, histograms, eye diagrams, etc.

WM8Zi-CBL-DE-EMBED