WAVEPULSER-SI-STUDIO-NRZ

• S-parameters DC to 40 GHz, single-ended and mixed-mode
• Impedance Profile with <1 mm resolution, differential and common-mode
• Internal, automatic OSLT calibration
• USB-connected, small, lightweight
• Flexible display of the measurements
• Remove effects from fixtures, connectors and cables
• Emulate eye diagrams with CTLE, DFE and FFE equalization
• Advanced jitter analysis

Complete frequency characterization with a frequency range from DC to 40 GHz and supporting single-ended and mixed-mode S-parameters. Built-in automatic internal calibration is fast and easy. The OLST calibration kit supplied in the WavePulser-40iX-BUNDLE permits the measurement reference plane to be moved as required.

Precisely locate impairments with a spatial resolution of <1 mm and supporting both differential and common-mode impedance profiles. Both TDR and TDT capability are provided for complete coverage of both reflected and transmitted responses.

WavePulser 40iX measurements are ready for simulation for with standard deep toolbox for simulation, de-embedding and time-gating. A built-in eye diagram display also permits equalized emulation. Advanced jitter analysis permits measurement of Total (Tj), Random (Rj) and Deterministic (Dj) jitter with de-convolution of Dj into component parts and a variety of jitter views.

WavePulser calibration standards are built-in (included in the standard unit) and calibration is always automated, simple and fast - make one connection to the DUT and press Go. WavePulser does not require purchase of additional, external calibration standards. Furthermore, WavePulser's TDR/TDT-based approach is independent of setup, making calibration less likely.

WavePulser provides results to DC, and extending to 40 GHz of bandwidth, so TDR step response and time-gated and/or emulated physical layer signal responses can avoid extrapolations for low-frequency and DC response - ideal for interconnection systems. set and usability for high-speed interconnect testing.

• Signal Integrity (SI) Studio offers most complete Serial Data Analysis Toolbox available for NRZ and PAMn
• SI Studio uses SDA Expert (SDAX) framework that integrates everything – eye diagram, jitter, noise, crosstalk, equalization, and pulse response
• Unique Multi-view support with reference and comparison modes
• Streamlined graphical user interface (UI) with self-explanatory icons

The SI-STUDIO-NRZ performs jitter, eye diagram, noise, crosstalk, etc. measurements and analysis on NRZ signals, with comparison of results to a reference view/lane.

SI-STUDIO-UPG-PAM is an upgrade option to SI-STUDIO-NRZ to add jitter, eye diagram, noise, crosstalk, etc. measurements and analysis on PAM signals, with comparison of results to a reference view/lane.