Technical Library

Technical Library

The App Notes/LAB Brief section of the Teledyne LeCroy Technical Library lets you search for, browse, and print the latest technical documentation. A search aid allows you to filter documents by category or keyword.

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App Notes/LAB Brief

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Milliohm PDN Measurements with the SPARQ Network Analyzer

This application note discusses a technique for making ultra-low impedance measurements using the Teledyne LeCroy SPARQ Network Analyzer. The ability to measure impedance into the milliohms is critical for a number of areas of PCB design, especially in Power Distribution Networks (PDN). Using a specific test setup and some simple algebra we can use the SPARQ to accurately measure impedance down to 10 milliohms.

Configuring SPARQ and Signal Integrity Studio Time Domain Trace Properties

Beginning with version of the SPARQ and Signal Integrity Studio software application, users can display impedance profile and rho traces with units of distance on the X-axis rather than with units of time. Additionally, when using time as the X-axis rather than distance, users can select whether the time coordinate corresponds to the time delay or round-trip time, as you would measure directly from a TDR waveform. This Technical Brief describes how to use the new "Time Domain Trace Properties" window.

Determining Delay and Loss for SPARQ Time Domain Gating

This Operating Note describes how to determine the Delay and Loss inputs to the time domain gating algorithm that is used in LeCroy SPARQ series network analyzers to remove the effects of fixtures and launches.

Avoid a common S-Parameter Problem

How you assign ports can greatly affect measurement interpretation.

Using the S-parameter Import Feature to Convert to Mixed Mode - SPARQ and SI Studio

Beginning with version of the SPARQ and Signal Integrity Studio software application, users can import Touchstone files and convert the S-parameters to mixed mode, or to reassign port numbers. This application note describes how to use these features and provides examples for 4 and 12-port Touchstone files.

Using the Save and Recall Measurements Feature - SPARQ and SI Studio

The SPARQ software beginning with Version includes new features for saving and recalling measurements taken with your Teledyne LeCroy SPARQ series Signal Integrity Network Analyzer. These features allow users to easily reconstruct results previously taken, and then to generate updated S-parameters results – all without needing to re-run the measurement.

SPARQ - Measuring NEXT and FEXT Crosstalk with LeCroy SPARQ Signal Integrity Network Analyzers

Teledyne LeCroy SPARQ Signal Integrity Network Analyzers rapidly characterize crosstalk in interconnects, backplanes and cable assemblies. Both near-end crosstalk (NEXT) and far-end crosstalk (FEXT) can be measured using either single-ended or differential port assignments. With 8 and 12 port SPARQs (model numbers SPARQ-3008E and SPARQ-3012E), signal integrity engineers can validate their crosstalk models with multi-differential lane NEXT and FEXT measurements, at a fraction of the price of a VNA.

SPARQ - S-Parameter Measurements with the LeCroy SPARQ and Cascade Microtech Probes Using WinCal XE Calibrations

This in-depth application note describes how LeCroy SPARQ series signal integrity network analyzers and Cascade Microtech probes can be used to make quality S-parameter measurements. The software package WinCal XE from Cascade Microtech was used to calibrate the analyzer using a variety of calibration methods, including SOLR, hybrid SOLT-SOLR and LRRM-SOLR. The application note compares the results obtained using these calibration methods, and the steps taken to operate the analyzer along with the probes and WinCal XE software.

SPARQ - De-embedding Gigaprobes using Time Domain Gating

LeCroy SPARQ users can de-embed probes, connectors and launches from their S-parameter measurements using the Time Domain Gating feature of the SPARQ software. This application note describes how to make measurements with the DVT30-1mm Gigaprobes from DVT Solutions, and how to de-embed the probes from the measurement.

SPARQ - Factory Second-Tier Calibration Procedure for Users

The procedure includes a set of scripts that are available for download. This application note describes how to perform a "Factory 2nd-tier calibration". Users who wish to perform regular (e.g. annual) in-house calibration of their SPARQ should use this procedure to generate a "factory" calibration file that is applied "on-top" of the automatic internal calibration. With the factory 2nd-tier calibration, users can perform a periodic calibration of their SPARQ that is a true calibration, as opposed to a typical "performance verification procedure", which is often performed on other test instruments but which only verifies performance.