Products
Oscilloscopes
Oscilloscope Probes
Protocol Analyzers
PeRT
Waveform Function Generators
Logic Analyzers
TDR and S-Parameters
Spectrum Analyzers
Power Supplies
Digital Multimeters
Serial Data
Serial Data Standards
Serial Data Analysis
Support
Tech Library
Test Tools
Instrument Service
FAQ/Knowledgebase
Oscilloscope Security
Product Registration
Software Downloads
Technical Help
Request Info
RoHS & WEEE
Events & Training
Training
Windows 10 Upgrade
Update Profile
Contact Us
Buy
Oscilloscope Probes and Accessories
Protocol Analyzers and Accessories
Certified Pre-Owned Equipment
Request a Quote
Contact Us
English (United States)
English (Europe)
Français
Deutsch
Italiano
日本語
한국어
中文
Back to
WaveMaster / SDA / DDA 8 Zi-B Oscilloscopes
>
Resources
>
Conference Proceedings
Conference Proceedings
A 30 GHz Bandwidth, 80 GS/s Sample Rate Real-time Waveform Digitizing System
DesignCon 2005 - Eye Patterns in Scopes
DesignCon 2006 - Group Delay and its Impact on Serial Data Transmission and Testing
DesignCon 2007: A Comparison of Methods for Estimating Total Jitter Concerning Precision, Accuracy and Robustness
DesignCon 2007: Advanced Tools for High Speed Serial Data Measurements
DesignCon 2008: Validation Methods for S-parameter Measurement Based Models of Differential Transmission Lines
DesignCon 2009 - Jitter Transfer Measurement in Clock Circuits
DesignCon 2009 - Quantifying Crosstalk Jitter
DesignCon 2009 - Signal Integrity Measurement in High Bit Rate Systems
DesignCon 2011 - Unified Methodology of 3D-EM/Channel Simulation/Robust Jitter Decomposition
ECOC - QPSK 56 Gbaud Testing with LeCroy 830Zi
Wavelet Denoising For TDR Dynamic Range Improvement
