High-speed Serial Data Eye Diagram, Jitter, and Noise Analysis

Technology AnalysisTechnology Analysis
PCIe, USB, DisplayPortPCIe, USB, DisplayPort
ToolboxToolbox
Analyze LinksAnalyze Links
ConfidenceConfidence
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SDA Expert serial data analysis eye diagram, jitter histogram, jitter spectrum and jitter breakdown into total jitter, random and deterministic jitter

Simplified Serial Data Expertise

SDA Expert serial data analysis software is the first eye diagram and jitter analysis package with built-in technology expertise. It simplifies setup and expands debugging capabilities with tailored technology analysis for PCI Express, USB, DisplayPort and more.

  • Tailored technology analysis for PCI Express®, USB, Thunderbolt™, DisplayPort®, and more
  • Most Complete Serial Data Analysis Toolbox
  • Highest confidence for complex measurements

Simplified Serial Data Expertise

First Serial Data software with built-in expertise. Simplifies setup and expands debugging capabilities with new technology framework.

SDA Expert serial data analysis software comparing two eye diagrams from USB4 and USB4 specific jitter measurements on a USB-Type-C interface

Tailored Technology Analysis for PCI Express, USB, DisplayPort and More

  • Technology-specific measurement expertise is built in
  • Seamlessly transition from compliance to debug
  • Intuitive measurement selection saves time and avoids errors
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SDA Expert serial data analysis NRZ eye diagram, jitter histogram, jitter track, jitter FFT and random, deterministic and total jitter measurements

Most Complete Serial Data Analysis Toolbox

  • 4th generation toolset covers complete needs for NRZ and PAM signals
  • Integrates everything – jitter, noise, crosstalk, equalization, and pulse response
  • Unique Multi-view support with reference and comparison modes
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SDA Expert serial data analysis comparing four eye diagram and jitter scenarios with de-embedding a channel and using CTLE, DFE and FFE equalizer

Highest Confidence for Complex Measurements

  • One button setup saves setup time and avoids errors
  • Technology selections simplify the setup of complex measurements
  • Quickly document results and save data with built-in report generator
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Tailored technology analysis for PCI Express, USB, DisplayPort, and more

SDA Expert technology framework provides all the tools you need specific to each technology for easy and fast debugging outside of compliance testing.

SDA Expert serial data analysis software showing an example of technology framework for PCIe Gen6
SDA Expert built-in dedicated debug and measure functions shown for USB in the technology selection menu
SDA Expert has built-in a selection of test points for standards like USB3.2, USB4, Thunderbolt, PCIe and DisplayPort for easy link analysis
SDA Expert serial data analysis software show eye diagram of PCIe Gen6 signal together with PCIe Gen6 specific measurement parameter and step response

Speed up debugging with Teledyne LeCroy’s SDA Expert technology framework. Get all the debugging analysis you need that is usually only available in compliance packages.

  • Technology-based design from technology experts
  • Easy to setup and ready to use
  • Optimized for debugging outside compliance testing

Simply select the technology being tested and you are presented with technology-specific measurements, labeled as they are described in the technology standard document and meeting the specific requirements of the standard.

  • Predefined technology framework with added options simplify measurement setup
  • Benefit from the built-in expertise
  • Get all the tools you need for your application

With SDA Expert serial data analysis provides all the tools needed to measure the test points defined in the standards, even if these test points and/or the channel is not directly physically present.

  • Dynamic graphical visualization of channel and test point setup
  • Pre-defined test points simplifies setup and avoids errors
  • Build-In embedding /de-embedding and equalization

Many standards have specific measurement parameters and analysis requirements. With SDA Expert Serial Data Analysis, you get them all in one tool optimized for debugging.

  • Comply with the specifications of the standards
  • Optimized for debugging
  • Simple measurement selection save time and avoid errors

Technology Framework For USB 3.2, USB4, Thunderbolt, PCI Express, DisplayPort

Teledyne LeCroy has integrated its decades of experience with industry standards into the SDA Expert serial data analysis software. Take it to the next level with the new technology framework.

SDA Expert Serial Data Analysis software showing USB3.2. eye diagram, jitter and eye diagram parameter measured on a USB-C type interface
SDA Expert Serial Data Analysis software showing USB4. eye diagram, jitter and eye diagram parameter measured on a USB-C type interface
SDA Expert Serial Data Analysis software showing DisplayPort. eye diagram, jitter and eye diagram parameter measured on a USB-C type interface
SDA Expert PCIe 6.0 transition histogram including jitter breakdown such as Rj, udjdd, utj, dj, and tj

USB-C technology specific measurements defined in the DisplayPort CTS (compliance test specifications) are accessible at a touch of a button in SDA Expert software.

  • Easily configurable test point setup
  • Comprehensive eye diagram, jitter, and other USB-C PHY measurements
  • Simple, powerful equalization analysis
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USB-C technology specific measurements defined in the USB4 and Thunderbolt CTS (compliance test specifications) are accessible at a touch of a button in SDA Expert software.

  • Easily configurable test point setup
  • Comprehensive eye diagram, jitter, and other USB-C PHY measurements
  • Simple, powerful equalization analysis
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USB-C technology specific measurements defined in the DisplayPort CTS (compliance test specifications) are accessible at a touch of a button in SDA Expert software.

  • Easily configurable test point setup
  • Comprehensive eye diagram, jitter, and other USB-C PHY measurements
  • Simple, powerful equalization analysis
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PCI Express 6.0 introduces PAM4-specific jitter measurement methodologies thus making SDA Expert the ideal toolkit for characterizing PCIe transmitters

  • Breakdown the jitter measurement composition into the 48 transitions in the 52-UI jitter measurement pattern, 12 voltage level transitions, or a single aggregated set of jitter measurements
  • Transition histogram for each of the 48 transitions in the 52-UI jitter measurement pattern
  • Each of the 52 measurement table results are locked to its respective transition histogram
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Most Complete Serial Data Analysis Toolbox

SDA Expert Serial Data Analysis options provides all the tools you need for any high-speed serial data NRZ or PAM eye diagram, jitter, or noise measurement.

SDA Expert NRZ  eye diagram, jitter histogram, jitter track, jitter FFT and random, deterministic jitter together with eye diagram parameters
SDA Expert shows an eye diagram of  PAM4 signal and measures SNDR, RLM together with jitter and eye diagram parameters
SDA Expert shows noise as track function, histogram and in the frequency domain and measure, extrapolate and decompose vertical noise
De-embedding of fixtures and test cables from TP1 to TP2 or emulating the channel at TP3 using S-parameters and SDA Expert
SDA Expert comparing four scenarios with eye diagram and jitter,  embedding and de-embedding a channel and using CTLE, DFE and FFE equalizers

The SDA Expert Serial Data software options provides the most comprehensive NRZ jitter decomposition, eye diagram and analysis tools with advanced signal integrity tools for emulation, de-embedding and equalization simulation

  • 4th generation toolset covers complete needs for NRZ signals
  • Integrates everything – jitter, noise, crosstalk, equalization, and pulse response
  • Comprehensive Jitter Decomposition & Analysis

The SDA Expert Serial Data Analysis software option provides comprehensive PAM3 and PAM4 eye diagram, jitter and noise measurements for analysis of random, deterministic, and periodic impairments for each eye opening of multi-level PAM signals.

  • Most Complete SNDR and RLM Analysis
  • Powerful visualization tools for identifying unexpected noise and distortion components
  • Comprehensive jitter and noise breakdown capability

With SDA Expert Serial Data Analysis software get a full suite of vertical noise measurement and crosstalk analysis tools for complete aggressor/victim analysis.

  • Noise track, histogram and spectrum, providing insight into the vertical noise
  • LaneScape Comparison mode to generate crosstalk eyes on multiple lanes
  • Innovative crosstalk eye contour plot shows the effects of excessive noise

With SDA Expert Serial Data Analysis software, quickly characterize the entire signal path from transmitter to receiver, capture high-fidelity waveforms at a convenient test point, and then easily analyze the signal at any point of interest

  • De-embed fixtures and test cables
  • Emulate real-world channel losses
  • Emulate transmitter and receiver equalization
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SDA Expert Serial Data Analysis software’s multiple views and reference analysis quickly identifies differences and accelerates debugging

  • Use the Reference Lane for Multi-Scenario Testing
  • Measure Multiple Lanes Simultaneously
  • Multi-Point and Multi-Configuration Analysis

Highest Confidence For Complex Measurements

SDA Expert Serial Data Analysis provides the highest confidence while being streamlined for simplicity and ease of use.

Configure SDA Expert Serial Data Analysis software with de-embedding and equalizing using one button instead of using a complex wizard
SDA Expert built-in dedicated debug and measure functions which can be easily addressed by the technology selection menu
SDA Expert Serial Data Analysis software has build-in reporting function to save setup, raw data and report for all kind of jitter and serial data analysis on NRZ and PAM signals at the touch of a button
SDA Expert Serial Data Analysis software streamlined graphical user interface

Trust the expertise of SDA Expert Serial Data Analysis software and use the one-button operation instead of struggling with wizards

  • One-button setup instead of complex wizards
  • Optimized to save setup time
  • Show the most relevant jitter views and eye diagrams

Benefit from the expert knowledge of SDA Expert Serial Data Analysis Software and start your analysis with just a few clicks.

  • Predefined Technologies framework simplify setup
  • Benefit from the built-in expertise
  • Get all the tools you need for your application

With SDA Expert Serial Data Analysis software report function save your data for future analysis and generate comprehensive reports at the touch of a button.

  • Save data, setup and create a report at the same time
  • Analyzed the stored data later in the scope or offline using MAUI Studio
  • Create a report containing all relevant settings as well as an informative screenshot.

Keep track of settings and save time with the optimized streamlined graphical user interface (UI) with self-explanatory icons. Get helpful information about missing or incorrect settings through the status information.

  • Icons make it simple to find the needed function
  • Streamlined graphical UI helps with the order of settings
  • Status bars provide information about missing or incorrect settings

Serial Data Eye Diagram and Jitter Analysis Compare – Teledyne LeCroy, Keysight, Tektronix

Teledyne LeCroy SDA Expert has unique technology-specific capabilities and is intuitive and easy to use. Compare to Keysight and Tektronix serial data eye diagram and jitter analysis software options that require purchase of multiple options to get the same capability as SDAX-COMPLETE.

NRZ

Eye Diagram and Eye Measure
Jitter Measure, Track, Histogram, Spectrum
Pulse Response and Tx EQ

PAMn

Eye Diagram and Eye Measure
Jitter Measure, Track,Histogram
Pulse Response, Tx EQ and SNDR

Noise / Crosstalk

Noise Measure, Track,Histogram, Spectrum
Crosstalk Eye Diagram Overlay

Embedding / De-Embedding

Embedding / De-Embedding
Equalizing

View

Multi-view
Reference View

Productivity

Graphical User Interface
Report Generator
Automatic Test Point Setup

Technology Specific Solutions

PCIe 2.0
PCIe 3.0
PCIe 4.0
PCIe 5.0
PCIe 6.0
USB 3.2
USB and Thunderbolt
DisplayPort 1.4
DisplayPort 2.0
Teledyne LeCroy
SDAX-COMPLETE
(SDAX-PCIE-NRZ)
(SDAX-PCIE-NRZ)
(SDAX-PCIE-NRZ)
(SDAX-PCIE-NRZ)
(SDAX-PCIE6)
(SDAX-USB32)
(SDAX-USB4-TBT)
(SDAX-DP)
(SDAX-DP)
Keysight
Multiple Options Required
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Tektronix
Multiple Options Required
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(PAMPCIE6)
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Resources

Document Name Document Type  
SDA Expert Data Sheet

Datasheet

Download PDF
SDA Expert Software Instruction Manual Download PDF

Manual

Download PDF

Jitter University Webinar Series

Confused about jitter? Did someone’s explanation of jitter create more questions than answers? If so, join Teledyne LeCroy as we teach everything about jitter – what jitter is, different categories, instruments used, measurements and views, deconvolution and extrapolation, and more.

Register for all
Part 1 - Introduction to Jitter

In this session, we provide basic jitter definitions and categories, describe the types of instruments historically and currently used to measure jitter, and jitter measurement instrument strengths and weaknesses.

Part 2 – Learning About Jitter on the Edge

In this session, we illustrate examples of measuring jitter using acquisitions comprised of one or two edges. Various measurement techniques are described with their historical antecedents. Instrument impact on jitter measurement accuracy is also discussed.

Part 3 – Taking the Long View of Jitter

In this session, we leverage the use of modern digital oscilloscopes to make more jitter measurements faster and more accurately. We will also calculate statistics, view histograms on data sets, and view how jitter changes with time or frequency to better understand underlying jitter pathologies.

Part 4 – Practical Jitter Debug and Measurement Examples

In this session, we introduce spectral analysis of jitter as a debug tool, and provide other practical examples of using statistical and time domain analysis tools in the oscilloscope to uncover the root cause of jitter problems.

Part 5 – Fundamentals of Serial Data Jitter Measurements

In this session, we provide basic jitter definitions and categories, describe the types of instruments historically and currently used to measure jitter, and jitter measurement instrument strengths and weaknesses.

Part 6 – Serial Data Jitter Separation, Extrapolation, and Jitter Views

In this session, we describe what the total jitter at a given bit error rate (Tj@BER) is and how it is derived from time interval error (TIE) measurements using extrapolation models. Random jitter (Rj) and deterministic (Dj) separation is explained, with further explanation of Dj separation into data-dependent jitter (DDj), duty cycle distortion (DCD), intersymbol interference (ISI), bounded uncorrelated jitter (BUj), and periodic jitter (Pj), with examples provided.

Part 7 – Advanced Course on Serial Data Jitter Measurements

In this session, we dive deeper into the various measured and extrapolated jitter views, and explain statistical and time-varying views of jitter in serial data link margins as viewed with an eye diagram.

How to De-embed and Emulate Serial Data Links Using Oscilloscopes

Join Teledyne LeCroy to learn about the various oscilloscope de-embedding and embedding/emulation techniques for high-speed serial data links, interconnects, and channels and oscilloscope probes. We will discuss the various types of tools commonly available in high-bandwidth oscilloscopes, such as de-embedding and emulation, using s-parameter measurement files or circuit models.

How to De-embed Interconnect Elements in Both Frequency and Time Domains

Join Teledyne LeCroy as we describe and demonstrate best practices for de-embedding test fixtures, cables, and probes from serial data link and other signal integrity measurements. This is a critically important process to ensure that the signal integrity measurements for the DUT are not contaminated by the interconnection elements

Signal Integrity on High Speed Serial Data, Jitter Analysis, Probe De-Embedding

In this webinar we will explain how to debug High speed serial data Signal Integrity, equalization, Jitter measurements, embedding and de-embedding interconnections and probes.

High Speed Serial Data Debugging and Analysis

In this seminar we will explain how to debug High speed serial data Signal Integrity, equalization, Jitter measurements, embedding and de-embedding interconnections and probes.

How to Accelerate and Improve 16+ Gb/s Serial Data Transmitter/Receiver Test and Debug

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements

Fundamentals of Characterizing High-speed Serial Data Interconnects Webinar

Join Teledyne LeCroy to learn more about the impact of high-speed serial data interconnects on your circuit design. We will discuss S-parameters and impedance profiles and how to interpret them, and then use S-parameter files to make eye diagram and jitter measurements on a differential signal passing through a sample channel.

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